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The Depth of a Silicon Wafer Is Targeted at 1

question 18

Multiple Choice

The depth of a silicon wafer is targeted at 1.015 mm. If properly functioning, the process produces items with a mean of 1.015 mm and a standard deviation of ±0.004 A sample of 16 items is measured once each hour. The sample means for the past 12 hours are given in the table below. From the table of data, determine the most accurate mean control chart.  Hour 123456 Mean 1.0131.0151.0161.0171.0141.013 Hour 789101112 Mean 1.0141.0171.0161.0131.0171.016\begin{array}{cccccc}\text { Hour }&1 & 2 & 3 & 4 & 5 & 6 \\\\\text { Mean }&1.013 & 1.015 & 1.016 & 1.017 & 1.014 & 1.013 \\\text { Hour }&7 & 8 & 9 & 10 & 11 & 12 \\\\\text { Mean }&1.014 & 1.017 & 1.016 & 1.013 & 1.017 & 1.016\end{array}

Apply the fundamental assumptions required for one-way ANOVA.
Recognize appropriate distribution for test statistics in ANOVA.
Calculate and interpret the pooled standard deviation in the context of ANOVA.
Assess the impact of statistical procedures on post hoc testing.

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