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The Within-Run Component of Variation Is Caused By

question 14

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The within-run component of variation is caused by:
1) sampling and pipetting precision.
2) short-term variations in temperature of the instrument.
3) instability of the calibration curve.
4) short-term variations in the stability of the instrument.


Definitions:

Yield Curve

The curve that results when the yield to maturity is plotted on the y-axis with term to maturity on the x-axis.

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