Examlex
The number of transistors per square inch on an integrated chip doubles every 18 months according to Moore's Law.
High Reliability
The concept or state of being able to function under high levels of uncertainty or risk without significant failures or accidents.
Content Validity
The extent to which a test measures the entire range of material or behavior that is supposed to be measured.
Low Validity
A term indicating that the effectiveness or correctness of a measurement or test is questionable or lacking.
Binet-Simon Scale
The first intelligence test, developed by Alfred Binet and Théodore Simon, designed to identify children with learning impairments.
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